Pt-W alloy proposed for thinner High-NA EUV mask absorbers
Researchers from the Chinese Academy of Sciences, Jilin University and other institutions published a paper evaluating a Pt-W alloy as an alternative low-n EUV mask absorber. The study examines film properties and imaging performance; it appeared in iScience in August 2026.
- Pt-W alloy studied as a low-n absorber for next-gen EUV masks
- Paper published in iScience in August 2026
- Film properties and imaging performance of the absorber assessed
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