Teradyne unveils Magnum E2 memory test system for AI memory

Teradyne announced Magnum E2, a memory test system targeting advanced DRAM and flash technologies including LPDDR6, DDR6, GDDR7 and NAND. The platform uses its Near-DUT Test architecture and supports NRZ, PAM3 and PAM4 signaling.

• Supports LPDDR6, DDR6, GDDR7 and NAND flash
• Near-DUT Test architecture shortens signal path to the chip
• Supports NRZ, PAM3 and PAM4 and a programmable APG
• Shared platform covers engineering and production testing