CPO testing hits moving-target problem without design-for-test

Experts from Teradyne, Advantest, ISE Labs and Keysight discussed co-packaged optics testing: without design-for-test, each waveguide, resonator and photodiode must be checked individually, which does not scale. Optical components are more sensitive to slight offsets than electronic ones, and the test ecosystem remains immature.

• Without DFT, each waveguide, ring and photodiode is tested one at a time
• Optics is more offset-sensitive than electronics; heat and warpage hurt
• The industry has not settled on connector designs or laser sources
• Test flow spans up to five insertions: PIC, wafer, die, module, system