Teradyne Magnum E2 targets advanced DRAM and high-speed NAND

Teradyne launched the Magnum E2 memory test system for advanced DRAM and high-speed NAND flash. It supports LPDDR6, DDR6, GDDR7, NRZ/PAM3/PAM4 signalling, up to 64 test sites and 24.5K high-speed I/O pins.

• Supports LPDDR6, DDR6, GDDR7 and NAND flash interfaces
• Up to 64 test sites and 24.5K high-speed I/O pins
• NRZ, PAM3 and PAM4 signalling support
• Single platform for qualification through high-volume manufacturing