Hardware2 hOctober 19, 2026, 10:21

SK Hynix boosts metrology and inspection for 3D memory

SK Hynix is strengthening its metrology and inspection (MI) capabilities as the shift to 3D DRAM and increasingly complex NAND stacking push conventional semiconductor inspection to its limits. The company did not disclose specific technologies or timelines.

Digitimes

Open source

3D DRAM and multi-layer NAND complicate chip inspection
SK Hynix is expanding metrology and inspection (MI)
Specific technologies and timelines were not disclosed

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