Keysight, NPL and MPI enable sub-THz IC characterisation to 250 GHz

Keysight Technologies, the University of Glasgow, NPL and MPI Corporation have developed a method for continuous on-wafer characterisation of InP HEMT devices from near DC to 250 GHz in a single sweep. The approach combines Keysight instrumentation, MPI probing technology and NPL metrology, removing the need for multiple setups and calibrations.

• Continuous InP HEMT measurement from near DC to 250 GHz in one sweep
• Uses Keysight Single-Sweep 250 GHz Frequency Extender and SMU
• MPI supplied broadband on-wafer probing and calibration software
• NPL contributed high-frequency metrology and calibration methods