Shift left in chip fabs drives data volumes into hundreds of petabytes

Chipmakers are moving yield detection inside process modules, using equipment sensor data and AI/ML models for real-time control. Rising sampling rates, hundreds of parameters and sub-second analysis are pushing data volumes to hundreds of petabytes a year, straining data management and context.

• Sampling rates rose from about once per second to every tens of milliseconds
• Equipment suppliers added hundreds of parameters in recent years
• Some fabs now collect hundreds of petabytes of data per year
• In-module analysis requires sub-second processing