220-second X-ray scan images samples 27 times faster with one optic

Researchers from Germany, Switzerland and Japan demonstrated soft X-ray spectromicroscopy using a single reflection zone plate (RZP) at the P04 beamline of PETRA III at DESY. The setup images circular samples about 27 times faster than point-by-point scanning and captures a full spectroscopy dataset in roughly 220 seconds at 14–24 µm resolution.

• A single RZP reflects, focuses and disperses soft X-rays at once
• Full nitrogen K-edge RIXS dataset collected in ~220 seconds, 388.6–401.8 eV
• Resolution of 14–24 µm, imaging 27 times faster than point scanning
• Experiments ran at the P04 beamline of PETRA III in Hamburg