KAIST predicts blue OLED lifetime from magnetic-field brightness changes

A KAIST research team has developed a technique that predicts OLED lifetime by analyzing small brightness changes induced by a magnetic field. The method reduces the need for long operating tests and could speed up development of longer-lasting smartphone and TV displays.

• The method gauges blue OLED degradation via brightness response to a magnetic field
• Lengthy lifetime tests are replaced by quick analysis of small brightness shifts
• The work targets smartphone and TV displays